IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault scanner for reconfigurable logic

Proceedings Seventeenth Conference on Advanced Research in VLSI

Author(s): Shnidman, N.R. ; Mangione-Smith, W.H. ; Potkonjak, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Ann Arbor, MI, USA, USA
Conference Date: 15 September 1997
Page(s): 238 - 255
ISBN (Paper): 0-8186-7913-1
DOI: 10.1109/ARVLSI.1997.634857
Regular:

We propose a technique for online built-in self-test of Field Programmable Gate Arrays (FPGAs). The goal of this system is to detect deviations from the intended functionality of an FPGA without... View More

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