IEEE - Institute of Electrical and Electronics Engineers, Inc. - SOI MOSFET mismatch due to floating-body effects

1997 IEEE International SOI Conference Proceedings

Author(s): Mandelman, J.A. ; Assaderaghi, F. ; Hsu, L.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Fish Camp, CA, USA, USA
Conference Date: 6 October 1997
Page(s): 164 - 165
ISBN (Paper): 0-7803-3938-X
ISSN (Paper): 1078-621X
DOI: 10.1109/SOI.1997.634984
Regular:

To distinguish small differentials in voltage, circuits such as sense amplifiers and SRAM cells require transistors having closely matched electrical characteristics. For example, a mismatch in... View More

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