IEEE - Institute of Electrical and Electronics Engineers, Inc. - Metastability of SOI CMOS latches

1997 IEEE International SOI Conference Proceedings

Author(s): Tretz, C. ; Chuang, C.T. ; Terman, L.M. ; Anderson, C.J. ; Zukowski, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Fish Camp, CA, USA, USA
Conference Date: 6 October 1997
Page(s): 162 - 163
ISBN (Paper): 0-7803-3938-X
ISSN (Paper): 1078-621X
DOI: 10.1109/SOI.1997.634983
Regular:

SOI has recently emerged as a serious contender for low-power high-performance applications. This paper examines the metastability of CMOS latches based on partially-depleted (PD) SOI devices with... View More

Advertisement