IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement and simulation of self-heating in SOI CMOS analogue circuits

1997 IEEE International SOI Conference Proceedings

Author(s): Tenbroek, B.M. ; Lee, M.S.L. ; Redman-White, W. ; Edwards, C.F. ; Bunyan, R.J.T. ; Uren, M.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Fish Camp, CA, USA, USA
Conference Date: 6 October 1997
Page(s): 156 - 157
ISBN (Paper): 0-7803-3938-X
ISSN (Paper): 1078-621X
DOI: 10.1109/SOI.1997.634980
Regular:

Summary form only given. The influence of dynamic self-heating on SOI MOSFET device behaviour is becoming well known. Although digital circuits typically operate sufficiently fast that... View More

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