IEEE - Institute of Electrical and Electronics Engineers, Inc. - Breakdown analysis in JI, SOI and partial SOI power structures

1997 IEEE International SOI Conference Proceedings

Author(s): Udrea, F. ; Popescu, A. ; Milne, W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Fish Camp, CA, USA, USA
Conference Date: 6 October 1997
Page(s): 102 - 103
ISBN (Paper): 0-7803-3938-X
ISSN (Paper): 1078-621X
DOI: 10.1109/SOI.1997.634953
Regular:

Summary form only given. SOI could be the future technology for power devices and integrated circuits. Unlike the conventional Junction Isolation (JI) technology, SOI benefits from simple and... View More

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