IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hot-carrier degradation behavior in body-contacted SOI nMOSFETs

1997 IEEE International SOI Conference Proceedings

Author(s): Ji-Woon Yang ; Jong-Wook Lee ; Won-Chang Lee ; Min-Rok Oh ; Yo-Hwan Koh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Fish Camp, CA, USA, USA
Conference Date: 6 October 1997
Page(s): 38 - 39
ISBN (Paper): 0-7803-3938-X
ISSN (Paper): 1078-621X
DOI: 10.1109/SOI.1997.634921
Regular:

Hot-carrier degradation in body-contacted silicon-on-insulator (BC SOI) nMOSFETs has been investigated and compared to that in conventional partially-depleted SOI (PD SOI) and bulk... View More

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