IEEE - Institute of Electrical and Electronics Engineers, Inc. - Screening SOI substrates for radiation resistant space electronics applications

1997 IEEE International SOI Conference Proceedings

Author(s): Liu, S.T. ; Yue, J. ; Schrankler, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Fish Camp, CA, USA, USA
Conference Date: 6 October 1997
Page(s): 7 - 9
ISBN (Paper): 0-7803-3938-X
ISSN (Paper): 1078-621X
DOI: 10.1109/SOI.1997.634906
Regular:

Total device isolation, speed, density, and radiation hardness (SEU) are significant advantages of silicon-on-insulator (SOI) substrates over bulk Si substrates. Taking advantage of these... View More

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