IEEE - Institute of Electrical and Electronics Engineers, Inc. - Flashover as an illustration of the charge trapping and detrapping phenomena

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Damamme, G. ; Latham, R.V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Minneapolis, MN, USA, USA
Conference Date: 19 October 1997
Volume: 2
ISBN (Paper): 0-7803-3851-0
DOI: 10.1109/CEIDP.1997.641171
Regular:

Numerous works have been achieved to sort out the flashover origin. Recent investigations have shown the importance of charge injection at the insulator and metal interface and of the surface... View More

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