IEEE - Institute of Electrical and Electronics Engineers, Inc. - Determination of impulse breakdown voltage using least squares method

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Ismailoglu, H. ; Kalenderli, O. ; Ozkaya, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Minneapolis, MN, USA, USA
Conference Date: 19 October 1997
Volume: 1
ISBN (Paper): 0-7803-3851-0
DOI: 10.1109/CEIDP.1997.634605
Regular:

The paper describes the determination of critical impulse breakdown voltage and standard deviation, using least squares method. The methods, given in the literature, are explained briefly. The... View More

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