IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of multiconductor inhomogeneous uniformly coupled lines from TDR data

Electrical Performance of Electronic Packaging

Author(s): Tripathi, A. ; Tripathi, V.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: San Jose, CA, USA, USA
Conference Date: 27 October 1997
Page(s): 167 - 170
ISBN (Paper): 0-7803-8649-3
DOI: 10.1109/EPEP.1997.634063
Regular:

An algorithm to extract the normal mode parameters of uniformly coupled lines in an inhomogeneous medium is developed. The sufficiency of the measured multiport time domain reflection coefficient... View More

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