IEEE - Institute of Electrical and Electronics Engineers, Inc. - A simultaneous switching noise analysis of a high speed memory module including the test environments and system-level models

Electrical Performance of Electronic Packaging

Author(s): Joon-Ho Choi ; Kyung-Hwa Kim ; Jung-Bae Lee ; Taek-Soo Kim ; Jeong-Taek Kong ; Sang-Hoon Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: San Jose, CA, USA, USA
Conference Date: 27 October 1997
Page(s): 109 - 112
ISBN (Paper): 0-7803-8649-3
DOI: 10.1109/EPEP.1997.634050
Regular:

As memory module products become more byte-wide and operate at higher speeds, more of the simultaneous switching noise (SSN) is observed. This paper presents SSN analysis results of high speed... View More

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