IEEE - Institute of Electrical and Electronics Engineers, Inc. - Decay-time Use With Characterization Magnetoresistive Of ESD Materials For Recording Heads
Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium
Author(s): | Chung F. Lam ; Chang, C. |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 1997 |
Conference Location: | Santa Clara, California, USA, USA |
Conference Date: | 23 September 1997 |
Page(s): | 373 - 381 |
ISBN (Paper): | 1-878303-69-4 |
DOI: | 10.1109/EOSESD.1997.634265 |