IEEE - Institute of Electrical and Electronics Engineers, Inc. - Prediction Of ESD Protection Levels Devices In Thin Film SOI And Novel Protection Devices in thin film SOI Technology
Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium
Author(s): | Raha, P. ; Smith, J.C. ; Miller, J.W. ; Rosenbaum, E. |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 1997 |
Conference Location: | Santa Clara, California, USA, USA |
Conference Date: | 23 September 1997 |
Page(s): | 356 - 365 |
ISBN (Paper): | 1-878303-69-4 |
DOI: | 10.1109/EOSESD.1997.634263 |