IEEE - Institute of Electrical and Electronics Engineers, Inc. - Prediction Of ESD Protection Levels Devices In Thin Film SOI And Novel Protection Devices in thin film SOI Technology

Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium

Author(s): Raha, P. ; Smith, J.C. ; Miller, J.W. ; Rosenbaum, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Santa Clara, California, USA, USA
Conference Date: 23 September 1997
Page(s): 356 - 365
ISBN (Paper): 1-878303-69-4
DOI: 10.1109/EOSESD.1997.634263
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