IEEE - Institute of Electrical and Electronics Engineers, Inc. - Protection of high voltage power and programming pins
Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium
Author(s): | Maloney, T.J. ; Parat, K. ; Clark, N.K. ; Darwish, A. |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 1997 |
Conference Location: | Santa Clara, California, USA, USA |
Conference Date: | 23 September 1997 |
Page(s): | 246 - 254 |
ISBN (Paper): | 1-878303-69-4 |
DOI: | 10.1109/EOSESD.1997.634249 |