IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study Of The ESD Behavior Of Different Clamp Configurations In A 0.35/spl mu/m Cmos Technology

Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium

Author(s): Richier, C. ; Maene, N. ; Mabboux, G. ; Bellens, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Santa Clara, California, USA, USA
Conference Date: 23 September 1997
Page(s): 240 - 245
ISBN (Paper): 1-878303-69-4
DOI: 10.1109/EOSESD.1997.634248
Advertisement