IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic Threshold Body- And Gate-coupled SOI ESD Protection Networks

Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium

Author(s): Voldman, S. ; Assaderaghi, F. ; Mandelman, J. ; Hsu, L. ; Shahidi, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Santa Clara, California, USA, USA
Conference Date: 23 September 1997
Page(s): 210 - 220
ISBN (Paper): 1-878303-69-4
DOI: 10.1109/EOSESD.1997.634245
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