IEEE - Institute of Electrical and Electronics Engineers, Inc. - General EOS/ESD equation

Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium

Author(s): Smith, J.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Santa Clara, California, USA, USA
Conference Date: 23 September 1997
Page(s): 59 - 67
ISBN (Paper): 1-878303-69-4
DOI: 10.1109/EOSESD.1997.634226
Regular:

It is proposed the general EOS/ESD equation is nothing more than the heat equation driven by electrical power. Further that virtually all EOS/ESD failures are rooted in the thermal process.... View More

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