IEEE - Institute of Electrical and Electronics Engineers, Inc. - ESD issues in compound semiconductor high frequency devices and circuits

Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium

Author(s): Bock, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Santa Clara, California, USA, USA
Conference Date: 23 September 1997
Page(s): 1 - 12
ISBN (Paper): 1-878303-69-4
DOI: 10.1109/EOSESD.1997.634220
Regular:

The need of (electrostatic discharge) ESD protection for high frequency devices and circuits is underlined by reviewing the compound semiconductor material properties with emphasis to ESD stress... View More

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