IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detecting bridging faults in dynamic CMOS circuits

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): J.T.-Y. Chang ; E.J. McCluskey
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Test Technol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page Count: 4
Page(s): 106 - 109
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633022
Regular:

New methods for detecting bridging faults in dynamic CMOS circuits are proposed. We show that resistive shorts in CMOS dynamic circuits can cause intermittent failures and reliability problems. We... View More

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