IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability, test, and I/sub DDQ/ measurements

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): C.F. Hawkins ; A. Keshavarzi ; J.M. Soden
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Test Technol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page Count: 7
Page(s): 96 - 102
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633021
Regular:

I/sub DDQ/ measurements are strongly identified with CMOS IC testing, however I/sub DDQ/ also has long term links to IC reliability. This paper overviews the association of reliability and I/sub... View More

Advertisement