IEEE - Institute of Electrical and Electronics Engineers, Inc. - A high-speed low-voltage built-in current sensor

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Tsung-Chu Huang ; Min-Cheng Huang ; Kuen-Jong Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 90 - 94
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633020
Regular:

This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this... View More

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