IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-line CMOS BICS: an experimental study

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Y. Maidon ; Y. Deval ; F. Verdier ; J.B. Begueret ; J.P. Dom
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Test Technol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page Count: 5
Page(s): 85 - 89
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633019
Regular:

A CMOS built-in current sensor is proposed. It is dedicated to mixed signal circuits power supply current monitoring. It takes advantage of a parasitic resistor, so its implementation is very... View More

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