IEEE - Institute of Electrical and Electronics Engineers, Inc. - Estimation of partition size for I/sub DDQ/ testing using built-in current sensing

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Menon, S.M. ; Palmgren, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 68 - 72
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633016
Regular:

I/sub DDQ/ testing of CMOS circuits can detect faults that are not easily detected using traditional test techniques. The quiescent current drawn by CMOS devices is very small, and certain faults... View More

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