IEEE - Institute of Electrical and Electronics Engineers, Inc. - A hybrid (logic+I/sub DDQ/) testing strategy using an iterative bridging fault filtering scheme

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Tzuhao Chen ; I.N. Hajj
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Test Technol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page Count: 5
Page(s): 63 - 67
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633015
Regular:

In this paper we propose a new hybrid (logic+I/sub DDQ/) testing strategy for efficient bridging fault (BF) detection. In our strategy, logic and I/sub DDQ/ testings are applied in sequence so... View More

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