IEEE - Institute of Electrical and Electronics Engineers, Inc. - I/sub DDQ/ testing for submicron CMOS IC technology qualification

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Soden, J.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 52 - 56
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633013
Regular:

Sandia is manufacturing high reliability CMOS ICs with a 0.5 micron CMP technology, as part of the progression to 0.35 micron and smaller scale technologies. To qualify this technology for... View More

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