IEEE - Institute of Electrical and Electronics Engineers, Inc. - I/sub DDQ/ testing of a 180 MHz HP PA-RISC microprocessor with redundancy programmed caches
Digest of Papers IEEE International Workshop on IDDQ Testing
| Author(s): | Meneghini, T. ; Josephson, D. |
| Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 January 1997 |
| Conference Location: | Washington, DC, USA, USA |
| Conference Date: | 5 November 1997 |
| Page(s): | 44 - 51 |
| ISBN (Paper): | 0-8186-8123-3 |
| DOI: | 10.1109/IDDQ.1997.633012 |
Regular:
The Hewlett-Packard PA7300LC is a 180 MHz PA-RISC microprocessor consisting of 1.2 million core logic transistors and 8 million cache transistors. The design of the power distribution network for... View More
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