IEEE - Institute of Electrical and Electronics Engineers, Inc. - A comprehensive wafer oriented test evaluation (WOTE) scheme for the IDDQ testing of deep sub-micron technologies
Digest of Papers IEEE International Workshop on IDDQ Testing
Author(s): | Singh, A.D. |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 1997 |
Conference Location: | Washington, DC, USA, USA |
Conference Date: | 5 November 1997 |
Page(s): | 40 - 43 |
ISBN (Paper): | 0-8186-8123-3 |
DOI: | 10.1109/IDDQ.1997.633011 |
Regular:
As device dimensions approach 0.1 /spl mu/m, analog effects will play an even larger role in digital circuits. IDDQ measurements can be significantly affected by the observed wafer to wafer (and... View More