IEEE - Institute of Electrical and Electronics Engineers, Inc. - A comprehensive wafer oriented test evaluation (WOTE) scheme for the IDDQ testing of deep sub-micron technologies

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Singh, A.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 40 - 43
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633011
Regular:

As device dimensions approach 0.1 /spl mu/m, analog effects will play an even larger role in digital circuits. IDDQ measurements can be significantly affected by the observed wafer to wafer (and... View More

Advertisement