IEEE - Institute of Electrical and Electronics Engineers, Inc. - Current-mode techniques for self-testing analogue circuits

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Baturone, I. ; Sanchez-Solano, S. ; Richardson, A.M. ; Huertas, J.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 33 - 37
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633010
Regular:

The success of I/sub ddq/ testing for digital circuits has motivated several groups to investigate if the same or a similar method could be applied to analogue domain. The diverse behavior of... View More

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