IEEE - Institute of Electrical and Electronics Engineers, Inc. - I/sub CCQ/: a test method for analogue VLSI based on current monitoring

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): van Lammeren, J.P.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 24 - 28
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633008
Regular:

This paper introduces a test method for analogue (parts of) ICs that determines whether an IC is good or not by measuring the currents flowing through its constituent circuits. The I/sub CCQ/ test... View More

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