IEEE - Institute of Electrical and Electronics Engineers, Inc. - I/sub DDQ/ testable dynamic PLAs

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Sachdev, M. ; Kerkhoff, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 17 - 22
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633007
Regular:

Testing of bridging faults in PLAs by means of voltage testing is expensive. However, same can be done efficiently with I/sub DDQ/ testing. In this article we propose two I/sub DDQ/ testable PLA... View More

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