IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sequential circuit test generation for IDDQ testing of bridging faults

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Higamit, Y. ; Maeda, T. ; Kinoshita, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 12 - 16
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633006
Regular:

This paper presents a test generation method for sequential circuits assuming IDDQ testing. We consider external bridging faults and internal bridging faults as a target fault. Test generation for... View More

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