IEEE - Institute of Electrical and Electronics Engineers, Inc. - Random testing with partial circuit duplication and monitoring I/sub DDQ/

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Yokoyama, H. ; Xiaoqing Wen ; Tamamoto, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 7 - 11
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633005
Regular:

The advantage of random testing is that test application can be performed at a low cost in the BIST scheme. However, not all circuits are random pattern testable. In this paper, we present a... View More

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