IEEE - Institute of Electrical and Electronics Engineers, Inc. - Iddq test pattern generation for scan chain latches and flip-flops

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Makar, S.R. ; McCluskey, E.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 2 - 6
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633004
Regular:

A new approach, using Iddq, for testing the bistable elements (latches ad flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking... View More

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