IEEE - Institute of Electrical and Electronics Engineers, Inc. - Concentric circular sampling for texture analysis

Proceedings of International Conference on Image Processing

Author(s): Arof, H. ; Deravi, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Santa Barbara, CA, USA, USA
Conference Date: 26 October 1997
Volume: 3
ISBN (Paper): 0-8186-8183-7
DOI: 10.1109/ICIP.1997.632050
Regular:

This paper introduces new texture descriptors that perform well for rotated and unrotated texture images without the need to be trained with rotated samples. The algorithm uses a circular sampling... View More

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