IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fully Bayesian image segmentation-an engineering perspective

Proceedings of International Conference on Image Processing

Author(s): Morris, R. ; Descombes, X. ; Zerubia, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Santa Barbara, CA, USA, USA
Conference Date: 26 October 1997
Volume: 3
ISBN (Paper): 0-8186-8183-7
DOI: 10.1109/ICIP.1997.631978
Regular:

Developments in Markov chain Monte Carlo procedures have made it possible to perform fully Bayesian image segmentation. By this we mean that all the parameters are treated identically, be they the... View More

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