IEEE - Institute of Electrical and Electronics Engineers, Inc. - Tunneling emission from valence band of Si-MOS electron tunneling cathode

Author(s): Ikeda, J. ; Yamada, A. ; Okamoto, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Kyongju, Korea, Korea
Conference Date: 17 August 1997
Page(s): 593 - 597
ISBN (Paper): 0-7803-3786-7
DOI: 10.1109/IVMC.1997.627657
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