IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of Electron Emission Degradation in Silicon Field Emitter Arrays

Author(s): Yoon-Ho Song ; Jin Ho Lee ; Seung-Youl Kang ; Yong-II Lee ; Kyoung Ik Cho ; Hyung Joun Yoo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Kyongju, Korea, Korea
Conference Date: 17 August 1997
Page(s): 440 - 444
ISBN (Paper): 0-7803-3786-7
DOI: 10.1109/IVMC.1997.627616
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