IEEE - Institute of Electrical and Electronics Engineers, Inc. - Parallel contour recognition using matched filter

Proceedings of 12th IEEE International Symposium on Intelligent Control

Author(s): Dziech, A. ; Amuri, A. ; Hubert, M. ; Besbas, W. ; Nern, H.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Istanbul, Turkey, Turkey
Conference Date: 16 July 1997
Page(s): 293 - 296
ISBN (Paper): 0-7803-4116-3
ISSN (Paper): 2158-9860
DOI: 10.1109/ISIC.1997.626474
Regular:

An approach to parallel contour recognition is proposed. This approach is based on a matched filter in the spectral domain in parallel to selected geometrical features of contours such as length... View More

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