IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design and testing of a fuzzy logic based seeding depth control system

IEEE WESCANEX 97 Communications, Power and Computing. Conference Proceedings

Author(s): Tessier, T. ; Kinsner, W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Winnipeg, Manitoba, Canada, Canada
Conference Date: 22 May 1997
Page(s): 263 - 269
ISBN (Paper): 0-7803-4147-3
DOI: 10.1109/WESCAN.1997.627151
Regular:

The control system in this research utilizes a microprocessor-based fuzzy logic control process in combination with a novel seeding depth gauge system. The fuzzy algorithm is modelled upon... View More

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