IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test chip development to support standardization efforts

Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium

Author(s): Bright, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Austin, TX, USA
Conference Date: 13 October 1997
Page(s): 184 - 191
ISBN (Paper): 0-7803-3929-0
ISSN (Paper): 1089-8190
DOI: 10.1109/IEMT.1997.626900
Regular:

A test chip has been developed which integrates test structures for performing reliability testing, and thermal and electrical characterization on packages and assembly processes. This work... View More

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