IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluating the manufacturability of GaAs/AlGaAs multiple quantum well avalanche photodiodes using neural networks

Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium

Author(s): Ilgu Yun ; May, G.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Austin, TX, USA
Conference Date: 13 October 1997
Page(s): 105 - 112
ISBN (Paper): 0-7803-3929-0
ISSN (Paper): 1089-8190
DOI: 10.1109/IEMT.1997.626885
Regular:

This paper presents a novel methodology for the parametric yield prediction of GaAs/AlGaAs multiple quantum well (MQW) avalanche photodiodes (APDs). Even in a defect-free manufacturing... View More

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