IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fuzzy system reliability analysis based on vague set theory

1997 IEEE International Conference on Systems, Man, and Cybernetics. Computational Cybernetics and Simulation

Author(s): Shyi-Ming Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Orlando, FL, USA, USA
Conference Date: 12 October 1997
Volume: 2
ISBN (Paper): 0-7803-4053-1
ISSN (Paper): 1062-922X
DOI: 10.1109/ICSMC.1997.638243
Regular:

In this paper, we present a new method for fuzzy system reliability analysis based on vague set theory, where the reliability of the components of a system are represented by vague sets defined in... View More

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