IEEE - Institute of Electrical and Electronics Engineers, Inc. - Correction of near-field effects in phased array element pattern measurements

IEEE Antennas and Propagation Society International Symposium 1997. Digest

Author(s): H.M. Aumann
Sponsor(s): Antennas & Propagation Soc. IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Montreal, Quebec, Canada, Canada
Conference Date: 13 July 1997
Volume: 1
Page Count: 4
ISBN (Paper): 0-7803-4178-3
DOI: 10.1109/APS.1997.630227
Regular:

Differences in phased array element patterns measured in the near-field and far-field are shown to be due to attenuation and distortion of mutual coupling and edge diffraction effects in the... View More

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