IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new near-field sampling representation from samples on planar spirals

IEEE Antennas and Propagation Society International Symposium 1997. Digest

Author(s): O.M. Bucci ; G. D'Elia
Sponsor(s): Antennas & Propagation Soc. IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Montreal, Quebec, Canada, Canada
Conference Date: 13 July 1997
Volume: 1
Page Count: 4
ISBN (Paper): 0-7803-4178-3
DOI: 10.1109/APS.1997.630115
Regular:

A new convenient scanning geometry, the bi-polar one, has been introduced which allows simpler mechanical movements of the positioning system, thus enhancing its reliability and reducing its cost.... View More

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