IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microwave diversity imaging using six-port reflectometer
IEEE Antennas and Propagation Society International Symposium 1997. Digest
Author(s): | Hsin-Chia Lu ; Tah-Hsiung Chu |
Sponsor(s): | Antennas & Propagation Soc. IEEE |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 1997 |
Conference Location: | Montreal, Quebec, Canada, Canada |
Conference Date: | 13 July 1997 |
Volume: | 4 |
Page Count: | 4 |
ISBN (Paper): | 0-7803-4178-3 |
DOI: | 10.1109/APS.1997.625537 |
Regular:
We use a six-port reflectometer for microwave diversity imaging measurement in a compact range arrangement and develop the associated calibration method. In the calibration, a reference scattering... View More