IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microwave diversity imaging using six-port reflectometer

IEEE Antennas and Propagation Society International Symposium 1997. Digest

Author(s): Hsin-Chia Lu ; Tah-Hsiung Chu
Sponsor(s): Antennas & Propagation Soc. IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Montreal, Quebec, Canada, Canada
Conference Date: 13 July 1997
Volume: 4
Page Count: 4
ISBN (Paper): 0-7803-4178-3
DOI: 10.1109/APS.1997.625537
Regular:

We use a six-port reflectometer for microwave diversity imaging measurement in a compact range arrangement and develop the associated calibration method. In the calibration, a reference scattering... View More

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