IEEE - Institute of Electrical and Electronics Engineers, Inc. - A resonant technique to measure the dielectric properties of planar materials

IEEE Antennas and Propagation Society International Symposium 1997. Digest

Author(s): W.R. Humbert ; W.R. Scott, Jr.
Sponsor(s): Antennas & Propagation Soc. IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Montreal, Quebec, Canada, Canada
Conference Date: 13 July 1997
Volume: 4
Page Count: 4
ISBN (Paper): 0-7803-4178-3
DOI: 10.1109/APS.1997.625433
Regular:

A previously introduced resonant measurement technique is extended to include dielectric sheets. The technique it is not limited by the sheet's thickness or dielectric constant because it involves... View More

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