IEEE - Institute of Electrical and Electronics Engineers, Inc. - Broadband, high-temperature dielectric properties measurements of thin substrates using open-ended probes

IEEE Antennas and Propagation Society International Symposium 1997. Digest

Author(s): S. Bringhurst ; M.F. Iskander ; M.J. White
Sponsor(s): Antennas & Propagation Soc. IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Montreal, Quebec, Canada, Canada
Conference Date: 13 July 1997
Volume: 4
Page Count: 4
ISBN (Paper): 0-7803-4178-3
DOI: 10.1109/APS.1997.625432
Regular:

A metallized-ceramic probe has been designed for high-temperature broadband dielectric properties measurements. The probe has been used to make complex dielectric properties measurements over the... View More

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