IEEE - Institute of Electrical and Electronics Engineers, Inc. - A comparative study of five regression testing algorithms

Proceedings of Australian Software Engineering Conference ASWEC 97

Author(s): Baradhi, G. ; Mansour, N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Sydney, NSW, Australia, Australia
Conference Date: 29 September 1997
Page(s): 174 - 182
ISBN (Paper): 0-8186-8081-4
DOI: 10.1109/ASWEC.1997.623769
Regular:

We compare five regression testing algorithms that include: slicing, incremental, firewall, genetic and simulated annealing algorithms. The comparison is based on the following ten quantitative... View More

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