IEEE - Institute of Electrical and Electronics Engineers, Inc. - On Kleene-Diens inference

Proceedings of North American Fuzzy Information Processing

Author(s): Whalen, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Berkeley, CA, USA, USA
Conference Date: 19 June 1996
Page(s): 536 - 540
ISBN (Paper): 0-7803-3225-3
DOI: 10.1109/NAFIPS.1996.534792
Regular:

The Kleene-Diens implication operator is defined in terms of the min T-norm, which is the limit of the Schweizer-Sklar (1961) T-norm as the parameter p grows without bound. Consider a fuzzy... View More

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