IEEE - Institute of Electrical and Electronics Engineers, Inc. - Self-checking and fail-safe LSIs by intra-chip redundancy

Proceedings of Annual Symposium on Fault Tolerant Computing

Author(s): Kanekawa, N. ; Nohmi, M. ; Satoh, Y. ; Satoh, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Sendai, Japan, Japan
Conference Date: 25 June 1996
Page(s): 426 - 430
ISBN (Paper): 0-8186-7262-5
ISSN (Paper): 0731-3071
DOI: 10.1109/FTCS.1996.534628
Regular:

The paper describes self checking LSIs realized by intra chip redundancy. Self checking comparators within the self checking LSI chips monitor the operation of redundant functional blocks to... View More

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